On The Scope – A Masterclass in Practical Scanning Electron Microscopy
Online learning begins April 1, 2024; in-person labs will be held April 29-30 or May 6-7.
Course Description
On The Scope – A Masterclass in Practical Scanning Electron Microscopy is a training program covering the fundamentals of scanning electron microscopy (SEM) operation. The program is provided by The Ohio State University Center for Electron Microscopy and Analysis (CEMAS), a unique facility containing more than $40 million in electron microscopes, expert technical staff, and a state-of-the-art digital theater.
On The Scope participants register for a Researcher Track OR a Manager Track:
Component #1 (for all On the Scope participants):
Course content and lectures will be available beginning April 1, 2024. A series of asynchronous lectures and demonstration sessions delivered 100% online with forums available for discussion. Instructor office hours (exact times to be determined) will be the week of April 22nd. Along with a recommended foundation of topics, a selection of elective lectures will be offered (listed below).
Component #2 (On the Scope participants attend Researcher OR Manager Track):
Researcher Track Component #2:
(in-person April 29-30, 2024 OR May 6-7, 2024): Participants choose one of the two date ranges to attend.
The labs are delivered in person using the established educational facilities and equipment at CEMAS. Along with a recommended foundation of topics, a selection of elective labs will be offered (listed below).
Manager Track Component #2:
(4-hour instrument session to be scheduled after registration) Participants schedule a 4-hour, 1-on-1 workshop with CEMAS staff for hands-on microscope session to image their own samples that can be done in-person or online.
Imaging and demonstration can be performed on participant provided samples. Techniques will be discussed and a plan for the session determined ahead of time.
Upon completion of the program, participants will be able to:
- Understand the operating principles and applications of SEMs.
- Perform a variety of common SEM imaging and analysis tasks.
- Improve the quality of their own SEM data collection and analysis.
- Participants who complete the program also receive a certificate of completion from CEMAS and the College of Engineering.
Program Component Details
Component #1 for ALL On The Scope participants:
Course content and lectures will be available beginning April 1, 2024. A series of asynchronous lectures and demonstration sessions delivered 100% online with forums available for discussion. Instructor office hours (exact hours to be determined) will be the week of April 22nd. Along with a recommended foundation of topics, a selection of elective lectures will be offered.
Accordions
- Introduction to scanning electron microscopy (SEM)
- Electron sources probe formation
- Detectors in the SEM
- Sample Prep
- High resolution imaging
- Non-conductive sample imaging
- Energy dispersive X-Ray spectroscopy (EDS)
- Electron backscatter diffraction (EBSD)
- Cathodoluminescence
- In-situ/environmental SEM
- STEM in SEM
- Intro to FIB
- Semiconductor defect analysis
- Metallography/fractography
- Image analysis
- EDS data analysis
- EBSD data analysis
- Large area Imaging
Component #2:
Researcher Track Component #2:
(in-person April 29-30, 2024 OR May 6-7, 2024): Participants choose one of the two date ranges to attend.
The labs are delivered in person using the established educational facilities and equipment at CEMAS. Along with a recommended foundation of topics, a selection of elective labs will be offered (listed below).
Time | Lab Day 1: 4/29/24 OR 5/6/24 | Lab Day 2: 4/30/24 OR 5/7/24 |
---|---|---|
8-10AM | Basic Imaging | Elective Lab |
10-10:30AM | Coffee Break | Coffee Break |
10:30AM-12:30PM | Alignments | Elective Lab |
12:30-1:30PM | Lunch Break/Optional CEMAS Tour | Lunch Break |
1:30-3:30PM | Advanced Modes OR EDS | Elective Lab |
3:30-4PM | Coffee Break | Coffee Break |
4-6PM | Advanced Modes OR EDS | Elective Lab |
Manager Track Component #2:
(4-hour instrument session to be scheduled after registration) Participants schedule a 4-hour, 1-on-1 workshop with CEMAS staff for hands-on microscope session to image their own samples that can be done in-person or online.
Imaging and demonstration can be performed on participant provided samples. Techniques will be discussed and a plan for the session determined ahead of time.
Accordions
- Basic imaging
- Instrument alignment
- Advanced imaging detectors
- EDS
- Electron backscatter diffraction
- Cathodoluminescence
- Large area imaging
- Metallographic analysis
- Semiconductor imaging
- Biological sample imaging
- In-situ/environmental SEM
- STEM in SEM
- Variable pressure SEM/non-conductive imaging
- Advanced EDS
- Ultra-high resolution imaging
Program Learning Objectives
After completing both the lecture and laboratory components, participants will be able to:
Accordions
- Describe the basic components of an SEM column
- Explain the differences between SEMs and other electron/x-ray imaging techniques
- Recognize the applications for which SEMs are most suitable
- Understand the types of signals generated within SEM chambers
- Relate the importance of proper preparation for different types of SEM samples
- Define and describe all relevant imaging terminology (resolution, pixel size, field width, etc)
- Relate the differences between information contained in images formed by various types of signals and detectors
- Understand how different microscope and acquisition settings affect image quality
- Demonstrate how to acquire different types of images
- Explain how different material types require different imaging strategies
- Understand the process of EDS data collection and analysis
- Describe the advantages and disadvantages between spot, line, and map collection schemes, and explain when each type is most appropriate
- Relate the importance of proper sample preparation for EDS analysis
- Explain the factors limiting accuracy and resolution of EDS results, especially quantification
- Demonstrate how to identify different elements present in a material
- Explain the different types of information obtainable through EBSD
- Relate the importance of proper sample preparation for EBSD analysis
- Explain the origins of Kikuchi patterns and the process of indexing them
- Describe the different types of ‘resolution’ in the context of EBSD
- Demonstrate the process of EBSD data acquisition and analysis
- Describe immersion lenses and explain their effects
- Define energy thresholding and demonstrate how to use it
- Define stage biasing and demonstrate how to use it
- Describe the benefits and limitations of variable pressure SEM operation
- Explain STEM imaging in SEMs, including its benefits/limitations
- Explain the TKD analysis process and its benefits/limitations
- Describe cathodoluminescence and what information it provides
Prerequisites
The workshop has open admission. While prior hands-on experience with SEMs and/or current employment in the field of SEM characterization will be beneficial, it is not a prerequisite. Experience with laboratory instrumentation such as spectrometers, vacuum systems or other imaging tools will be beneficial.
A special thanks to our course sponsors
COURSE REGISTRATION
Registration closes April 15, 2024.
Click below to register;
Points of Pride
PRICING
Course Fee:
$3,750 per person
Early Bird Discount:
$3,250 per person if registered by March 18, 2024.
Cancellations and Refunds
A full refund, minus a $75 administrative fee, will be made if cancellation is received three weeks prior to the start of the course.
No refunds will be issued within three weeks of the course start date.
CONTACT
About the Center for Electron Microscopy Analysis
CEMAS is the preeminent materials characterization hub for business and academia. There are over 300 active users and $130 million dollars used for research per year. Learn more about CEMAS.
“There's no better place on planet Earth to do microscopy than right here at CEMAS". -Don Kania, Former CEO of FEI Company
If you have questions regarding this course, please contact:
Professional & Distance Education Programs
Email: eng-profed@osu.edu
Call: 614-247-9581