Meet the 2023 Instructors & Speakers

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Meet the Speakers 

John Yorston headshot

John Yorston has been doing scanning electron microscopy and X-ray microanalysis (SEM-EDX) for almost thirty years, both in industry and in support of instrument sales and applications support. John is a veteran of countless SEM demonstrations and has conducted over 100 industrial new user short courses in SEM and microanalysis. John holds a BS in Chemistry from Fairleigh Dickinson University and has a background in Czockralski crystal growth of oxide and fluoride laser electro-optics and in ultra-high-pressure industrial diamond synthesis. John Yorston (Aka Fox Delta) is an accomplished and avid soaring pilot, and an active member of Aero Club Albatross based at Blairstown Airport, in New Jersey. 




Shawn Wallace joined EDAX in 2015 as an Applications Engineer specializing in EBSD. He has a strong background in all sorts of instrumentations including EBSD, electron microprobe, all sorts of mass spectrometry, and computed tomography. In his career, he has taught researchers of all levels, from post docs to undergrads, how to use instrumentation and he continues that here at EDAX.

Shawn earned his MS in Geology from the University of South Carolina. His research focused on method development for ICP-Mass spectrometry and geothermobarometry to help better understand planetary differentiation. After earning his degree, Shawn worked as a Scientific Assistant at the American Museum of Natural History in New York City, where he helped study the origin of the Solar System using EBSD and other instruments, including 3D work with computed tomography. Shawn hopes to bring those 3D skills to the rapidly expanding 3D EBSD world.



Meet the Instructors 


David McComb

David McComb, PhD, is the Director of the Center for Electron Microscopy and Analysis (CEMAS), an Ohio Research Scholar and Professor of Materials Science and Engineering at The Ohio State University. David is an expert in the development and application of electron energy-loss spectroscopy (EELS) as a sub-nanometer scale probe for chemistry, structure, and bonding. He has developed and implemented approaches to studying inorganic, organic, and molecular systems using electron microscopy techniques.





Tyler Grassman

Tyler Grassman, PhD, is an Associate Professor in the Departments of Materials Science & Engineering and Electrical & Computer Engineering at The Ohio State University. Tyler is an expert in semiconductor epitaxy, defect engineering, and device development, as well as structural and optoelectronic characterization. His group has pioneered and refined the use of various advanced SEM and TEM-based microscopy and spectroscopy methods for quantitative and correlative analysis of defects in a range of semiconductor systems.






Daniel Veghte, PhD, is a Senior Research Associate at the Center for Electron Microscopy and Analysis (CEMAS). In his role, he manages the scanning electron microscopes and works closely with users to characterize a broad range of materials. During his career, he has enjoyed pushing the limits of electron microscopy with an emphasis on performing in-situ experiments.






Elvin Beach headshot

Elvin Beach has a B.S. in Metallurgical Engineering, a M.S. in Materials Science & Engineering from Michigan Technological University, and a Ph.D. in Materials Science & Engineering from The Ohio State University.  Dr. Beach has worked extensively in applied failure analysis while working at The Dow Chemical Company, Battelle Memorial Institute, and Worthington Industries.  Dr. Beach has extensive experience in metallographic sample preparation, optical microscopy, and electron microscopy techniques.  Dr. Beach currently teaches undergraduate characterization lab courses, materials processing, and materials testing laboratories along with fracture, fatigue and failure analysis.  Dr. Beach is the editor in chief of the Journal of Failure Analysis and Prevention and an associate editor for Metallography, Microstructure, and Analysis.




Núria Bagués headshot

Núria Bagués, PhD, is an Assistant Professor in the Materials Science Department at The Ohio State University. Núria currently instructs the graduate level SEM and TEM courses in the MSE department along with enabling instructors from across the college use microscopy in their courses. In her research Núria has used a variety of electron microscopy techniques to characterize the microstructure, interfaces, and defects in complex oxide epitaxial thin films and functional nanostructure.